Revised <italic>L</italic>–2<italic>L</italic> Method for On-Chip De-Embedding

A New Document Embedding Method for News Classification

Abstract- Text classification is one of the main tasks of natural language processing (NLP). In this task, documents are classified into pre-defined categories. There is lots of news spreading on the web. A text classifier can categorize news automatically and this facilitates and accelerates access to the news. The first step in text classification is to represent documents in a suitable way t...

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs

A flexible noise de-embedding method for on-wafer microwave measurements of silicon MOSFETs is presented in this study. We use the open, short, and thru dummy structures to subtract the parasitic effects from the probe pads and interconnects of a fixtured MOS transistor. The thru standard are used to extract the interconnect parameters for subtracting the interconnect parasitics in gate, drain,...

A thru-only de-embedding method for on-wafer characterization of multiport networks

A Four-Step Method for De-Embedding Gigahertz On-Wafer CMOS Measurements

In this paper, a de-embedding method is proposed for conducting accurate on-wafer device measurements in the gigahertz range. The method addresses issues of substrate coupling and contact effects and is therefore suitable for measurements with lossy technologies such as CMOS. The method assumes a probe-tip two-port calibration performed with well-known techniques and impedance substrates. By em...

Generalized De-embedding Techniques

This paper discusses techniques for embedding and de-embedding the characteristics of two-port devices described by scattering parameters at microwave frequencies. Such techniques have wide applications in areas such as the measurement of the parameters of a semiconductor device mounted in a fixture, removal of the effects of cables, adapters, etc. and network analyzer calibration using variant...