Research on multi-frequency EFM dynamic process measurement method based on wavelet transform

Electrostatic force microscopy (EFM) has high sensitivity and lateral resolution, it is widely used to measure the electrostatic properties of new energy materials. The time-resolved microscope technology dynamic electrical materials, pump detection method commonly in this problems such as complex equipment, cost, uncertainty measurement. In work directly measuring time domain adopted. This reduces complexity By using multi-frequency or high-frequency excitation method, simultaneous measurement multiple EFM parameters improvement resolution can be achieved, reaching a microseconds, by applying wavelet transform tip signal obtained materials extracted. Applying simulation experiments, possible potential changes characteristic parameter ion movement microsecond-level process simulated battery