Reliability of LED-based systems

Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted ever-increasing design complexity, dramatically decreasing margins, increasing chances for consequences of failures, shortening product development qualification time, difficulties to meet quality, robustness, reliability requirements. The successes many micro/nano-related technology developments cannot lead business success without innovation breakthroughs in the way that we address through whole value chain. aim predict, optimize upfront micro/nanoelectronics systems, area denoted as ‘Design (DfR)’. While virtual schemes based on numerical simulation widely used functional design, they lack a systematic approach when assessments. Besides this, lifetime predictions still old standards assuming constant failure rate behavior. In this paper, will present failures found solid-state lighting systems. It includes both degradation catastrophic modes from observation towards full description its mechanism obtained by extensive use acceleration tests using knowledge-based methods. A case be presented more details.