Reliability Assessment and Screening by Reliability Indicator Methods
نویسندگان
چکیده
منابع مشابه
Methods and Metrics for Reliability Assessment
This paper deals with digital VLSI design aspects related to reliability. The focus is on the problem of reliability evaluation in combinational logic circuits. We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.
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ژورنال
عنوان ژورنال: ElectroComponent Science and Technology
سال: 1983
ISSN: 0305-3091
DOI: 10.1155/apec.11.71