Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels
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چکیده
منابع مشابه
TOTAL IONIZING DOSE EFFECTS IN ADVANCED CMOS TECHNOLOGIES By
Professor Sokrates T. Pantelides ii ACKNOWLEDGMENTS I would first of all like to thank my husband Pierre who has been supportive and patient with me on my journey of attaining a Ph.D. He believed in me even when I did not believe in myself, he listened countless times to my presentations and helped me perfect them. I would also like to thank my parents and my sister Myriam for everything they h...
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 2019
ISSN: 0018-9499,1558-1578
DOI: 10.1109/tns.2018.2884037