منابع مشابه
The Quality and Reliability of Intel’s Quarter Micron Process
This paper describes how the quality and reliability of Intel’s products are designed, measured, modeled, and maintained. Four main reliability topics: ESD protection, electromigration, gate oxide wearout, and the modeling and management of mechanical stresses are discussed. Based on an analysis of the reliability implications of device scaling (the process of a planned reduction of dimensions ...
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ژورنال
عنوان ژورنال: Journal of Photopolymer Science and Technology
سال: 1992
ISSN: 0914-9244,1349-6336
DOI: 10.2494/photopolymer.5.1