Quantitative Determination of Preferred Orientation by Energy-Dispersive X-Ray Diffraction
نویسندگان
چکیده
منابع مشابه
Energy-dispersive X-ray diffraction using an annular beam.
We demonstrate material phase identification by measuring polychromatic diffraction spots from samples at least 20 mm in diameter and up to 10 mm thick with an energy resolving point detector. Within our method an annular X-ray beam in the form of a conical shell is incident with its symmetry axis normal to an extended polycrystalline sample. The detector is configured to receive diffracted flu...
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Certain minerals in soil clays may be directly estimated from diffraction line intensity and the mass absorption coefficient of the sample to the radiation used. The main advantages of the method described are that no internal standards or calibration charts are required, and any diffraction line of the component to be estimated may be chosen. The results obtained compare favourably with chemic...
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X-Ray Diffraction (XRD) has long been used to determine the atomic-scale structure of materials. This technique is based on the fact that the wavelength of X-rays is comparable to the distances between atoms in condensed matter. When a material exhibiting a long-range (i.e. at least micrometers), periodic atomic order, such as a crystal, is irradiated with X-rays it acts as an extended, well-de...
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Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 ...
متن کاملThe determination of the efficiency of energy dispersive X-ray spectrometers by a new reference material.
A calibration procedure for the detection efficiency of energy dispersive X-ray spectrometers (EDS) used in combination with scanning electron microscopy (SEM) for standardless electron probe microanalysis (EPMA) is presented. The procedure is based on the comparison of X-ray spectra from a reference material (RM) measured with the EDS to be calibrated and a reference EDS. The RM is certified b...
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ژورنال
عنوان ژورنال: Texture of Crystalline Solids
سال: 1976
ISSN: 0309-7951
DOI: 10.1155/tsm.2.95