Pseudo Functional Path Delay Test through Embedded Memories
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 2014
ISSN: 0923-8174,1573-0727
DOI: 10.1007/s10836-014-5497-x