Potential sensitivities in frequency modulation and heterodyne amplitude modulation Kelvin probe force microscopes

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Potential sensitivities in frequency modulation and heterodyne amplitude modulation Kelvin probe force microscopes

In this paper, the potential sensitivity in Kelvin probe force microscopy (KPFM) was investigated in frequency modulation (FM) and heterodyne amplitude modulation (AM) modes. We showed theoretically that the minimum detectable contact potential difference (CPD) in FM-KPFM is higher than in heterodyne AM-KPFM. We experimentally confirmed that the signal-to-noise ratio in FM-KPFM is lower than th...

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On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy.

The influence of short-range electrostatic forces on the measured local contact potential difference (CPD) by means of amplitude-modulation and frequency-modulation Kelvin probe force microscopy (AM- and FM-KPFM) is discussed on the base of numerical and analytical descriptions of both methods. The goal of this work is to help in interpreting recent experimental results reporting atomically res...

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Noise performance of frequency modulation Kelvin force microscopy

Noise performance of a phase-locked loop (PLL) based frequency modulation Kelvin force microscope (FM-KFM) is assessed. Noise propagation is modeled step by step throughout the setup using both exact closed loop noise gains and an approximation known as "noise gain" from operational amplifier (OpAmp) design that offers the advantage of decoupling the noise performance study from considerations ...

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Spatial horizons in amplitude and frequency modulation atomic force microscopy.

In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation atomic force microscopy (AM-AFM and FM-AFM) have established themselves as the most powerful methods in the field. Nevertheless, it is still debatable whether one or the other technique is preferred in a g...

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Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy.

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air, and concurrently maintains spatial resolution and voltage sensitivity comparable to frequency-modulation KPFM, the current spatial resolution standard. Two com...

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ژورنال

عنوان ژورنال: Nanoscale Research Letters

سال: 2013

ISSN: 1556-276X

DOI: 10.1186/1556-276x-8-532