منابع مشابه
Strong Peak Points and Denseness of Strong Peak Functions
Let Cb(K) be the set of all bounded continuous (real or complex) functions on a complete metric space K and A a closed subspace of Cb(K). Using the variational method, it is shown that the set of all strong peak functions in A is dense if and only if the set of all strong peak points is a norming subset of A. As a corollary we show that if X is a locally uniformly convex, complex Banach space, ...
متن کاملPermutations with given peak set
Let Sn denote the symmetric group of all permutations π = a1 . . . an of {1, . . . , n}. An index i is a peak of π if ai−1 < ai > ai+1 and we let P (π) be the set of peaks of π. Given any set S of positive integers we define P (S;n) to be the set π ∈ Sn with P (π) = S. Our main result is that for all fixed subsets of positive integers S and all sufficiently large n we have #P (S;n) = p(n)2n−#S−...
متن کاملControl of Complex Peak-to-Peak Dynamics
The paper illustrates a method for the design of suitable controllers of chaotic systems characterized by complex peak-to-peak dynamics, namely by a recursive relationship between consecutive peaks (relative maxima) of a scalar output variable. For such systems, a reduced model can be defined which, in general, is a hybrid model composed of a one-dimensional map and a finite-state automaton. Th...
متن کاملUltrasonic Transducer Peak-to-peak Optical Measurement
Possible optical setups for measurement of the peak-to-peak value of an ultrasonic transducer are described in this work. The Michelson interferometer with the calibrated nanopositioner in reference path and laser Doppler vibrometer were used for the basic measurement of vibration displacement. Langevin type of ultrasonic transducer is used for the purposes of Electro-Ultrasonic Nonlinear Spect...
متن کاملInserting Test Points to Control Peak Power During Scan Testing
This paper presents a procedure for inserting test points at the outputs of scan elements of a full-scan circuit in such a manner that the peak power during scan testing is kept below a specified limit while maintaining the original fault coverage. If the power in a clock cycle during scan testing exceeds a specified limit (which depends on the peak power the chip has been designed to supply), ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Proceedings of the American Mathematical Society
سال: 1997
ISSN: 0002-9939,1088-6826
DOI: 10.1090/s0002-9939-97-03767-2