Optical constants of CH_3NH_3PbBr_3 perovskite thin films measured by spectroscopic ellipsometry
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چکیده
منابع مشابه
Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry
Spectroscopic Ellipsometry (SE) offers a precise technique for measuring thin film properties. Advanced SE instrumentation has been demonstrated as an excellent technique for monitoring the growth of optical films for sputtering applications. We have recently extended this technique for PVD E-gun evaporated films. In this paper we will show how an SE system was integrated into a standard optica...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2016
ISSN: 1094-4087
DOI: 10.1364/oe.24.016586