Novel Scanning Ion Microscope with H3+ Gas Field Ionization Source

Scanning transmission ion microscope with a field ion source.

Experiments with a low-resolution scanning transmission ion microscope, using hydrogen ions from a field ionization source, indicate that it will be feasible by this approach to aim at high-resolution ion microscopy. Micrographs of unstained biological specimens have been obtained by critical range absorption of a 55 keV hydrogen ion beam at a resolution of 2000 A.

Characterization of ion exchanged integrated lightwave devices with an apertureless scanning near-field optical microscope

Sébastien Aubert*, Elise Ghibaudo, Aurélien Bruyant*, Sylvain Blaize*, Renaud Bachelot*, Gilles Lerondel*, Pascal Royer*, Jean-Emmanuel Broquin [email protected] Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP2060, 10010 Troyes cedex, France Institut de Microélectronique, Electromagnétisme et Photonique, LEMO-ENSERG, UMR 5530,...

Ion irradiation effects on graphite with scanning tunneling microscope

Scanning reflection ion microscopy in a helium ion microscope

Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM). The reflected ions were detected by their "conversion" to secondary electrons on a pla...

Near-field Scanning Optical Microscope Platform