Nonlinear absorbance in dielectric multilayers

Tailoring dielectric properties of ferroelectric-dielectric multilayers

on Characterization of metal / dielectric multilayers with in - situ ellipsometry

The project was completed on 31 December 2010. In this project, we did simulations for metal/dielectric multilayer structures, their applications as hyperlens for sub-wavelength imaging with resolution beyond diffraction limit, optimized metal (silver) films and started fabrication and characterization of dielectric films with in-situ ellipsometry monitoring the thickness and optical constants....

Atomic-scale dielectric permittivity profiles in slabs and multilayers

A recently developed theory of atomic-scale local dielectric permittivity has been used to determine the position dependent permittivity profiles of a few nanoscale insulator surfaces and multilayers. Specifically, slabs containing single-component Si, polymer, and SiO2 and two-component Si-SiO2 and polymer-SiO2 systems of technological importance have been studied. The present approach indicat...

Toward superlensing with metal-dielectric composites and multilayers

We report on the fabrication of two types of adjustable, near-field superlens designs: metal–dielectric composites and metal–dielectric multilayer films. We fabricated a variety of films with different materials, thicknesses and compositions. These samples were characterized physically and optically to determine their film composition, quality, and optical responses. Our results on metal–dielec...

Multiscale analysis of subwavelength imaging with metal-dielectric multilayers.

Imaging with a layered superlens is a spatial filtering operation characterized by the point spread function (PSF). We show that in the same optical system the image of a narrow subwavelength Gaussian incident field may be surprisingly dissimilar to the PSF, and the width of the PSF is not a straightforward measure of the resolution. The FWHM or standard deviation of the PSF gives ambiguous inf...