New Ultra-High Resolution SEM for Imaging by Low Energy Electrons
نویسندگان
چکیده
منابع مشابه
Ultra High Energy Electrons Powered by Pulsar Rotation
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Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary magnifications (e.g. 100 000 x) a hydrated sample is usually severely damaged after one slow scan (about 3000 enm-2). The consequences of this beam damage are remarkably reduced by coating the frozen-hydrated sample with a ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2013
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927613008507