Nanomechanical characterization by double-pass force–distance mapping

Nanomechanical characterization by double-pass force-distance mapping.

We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interac...

Understanding aberrations by using double-pass techniques.

Opto-nanomechanical spectroscopic material characterization.

The non-destructive, simultaneous chemical and physical characterization of materials at the nanoscale is an essential and highly sought-after capability. However, a combination of limitations imposed by Abbe diffraction, diffuse scattering, unknown subsurface, electromagnetic fluctuations and Brownian noise, for example, have made achieving this goal challenging. Here, we report a hybrid appro...

FEATURE Nanomechanical Characterization of Materials by Nanoindentation Series

I nstrumented indentation testing (IIT) is a technique for measuring the mechanical properties of materials. It is a development of traditional hardness tests such as Brinell, Rockwell, Vickers, and Knoop. IIT is similar to traditional hardness testing in that a hard indenter, usually diamond, is pressed into contact with the test material. However, traditional hardness testing yields only one ...

Generalized Hertz model for bimodal nanomechanical mapping

Bimodal atomic force microscopy uses a cantilever that is simultaneously driven at two of its eigenmodes (resonant modes). Parameters associated with both resonances can be measured and used to extract quantitative nanomechanical information about the sample surface. Driving the first eigenmode at a large amplitude and a higher eigenmode at a small amplitude simultaneously provides four indepen...