Nano structures studied by convergent beam electron diffraction
نویسندگان
چکیده
منابع مشابه
Convergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
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The development of new materials requires an understanding of their mode of growth and the nature of defects, interfaces and strains thereby incorporated. This paper shows how convergent beam electron diffraction (CBED) and large angle CBED (LACBED) can be used to analyse such problems. It is shown how CBED and LACBED can give two-beam rocking curves, which can be used to profile plane rotation...
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The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by...
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The Convergent Beam Electron Diffraction technique (CBED) has been applied to determine the lattice strain in Sii-xGez/Si heterostructures and below patterned films on silicon substrates. The well known problem of the stress relaxation which occurs m thinned TEM samples has been overcome, m the case of the heterostructures, by applying the isotropic elasticity theory to the lattice constants me...
متن کاملRecent Advances in Quantitative Convergent Beam Electron Diffraction
Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper. The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam. Many more reflections are excited than in a ...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2005
ISSN: 0108-7673
DOI: 10.1107/s010876730509968x