Minority carrier lifetime in silicon photovoltaics: The effect of oxygen precipitation
نویسندگان
چکیده
منابع مشابه
Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers
In this study, we investigate the nature of some recombination active defects limiting the lifetime in Czochralski (CZ) silicon wafers, in the millisecond range. Due to their low concentrations, the observed defects are unlikely to be identified through Deep-Level Transient Spectroscopy (DLTS) or Electron Paramagnetic Resonance (EPR), hence we use lifetime spectroscopy combine with several anne...
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ژورنال
عنوان ژورنال: Solar Energy Materials and Solar Cells
سال: 2014
ISSN: 0927-0248
DOI: 10.1016/j.solmat.2013.06.018