Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy
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چکیده
منابع مشابه
Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملnano-structural characterization of post-annealed zno thin films by x-ray diffraction and field emission scanning electron microscopy
zno thin films were deposited on si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°c). dependence of the crystallographic structure, nano-strain, chemical composition and surface physical morphology of these layers on annealing temperature were studied. the crystallographic structure of films was studied using x-ray diffracti...
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Two dimensional materials created ab-initio by the process of condensation of atoms, molecules or ions, called thin films, have unique properties significantly different from the corresponding bulk materials as a result of their physical dimensions, geometry, non-equilibrium microstructure and metallurgy. These characteristic features of thin films can be drastically modified and tailored to ob...
متن کاملX-ray Diffraction Determination of Stresses in Thin Films
3 This paper presents the aethodology eaployed in the deteraination of the stress tensor for thin crystalline filas usine x-ray rockine curves . Use of the saae equipaent for the deteraination of the averaee stress in polyor non-c rystalline thin filas attached to a crystalline substrate is also di s cussed . In this case the lattice curvature of the substrate is deterained by measureaent of th...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2016
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2016.07.001