منابع مشابه
State of the Art Microanalysis Using Raman Microscopy
Introduction Raman spectroscopy is one of the most common techniques for materials identification and characterization. Based on inelastic scattering of a monochromatic excitation source, Raman measures vibrational, rotational and other low-frequency modes in a system. It’s not only characteristic for functional groups, but also sensitive to backbone and crystalline structures. Therefore, Raman...
متن کاملCombinaTexas 2018 February 10 – 11 , 2018
In this talk we give combinatorial proofs of q-Stirling identities using restricted growth words. This includes a poset theoretic proof of Carlitz’s identity, a new proof of the q-Frobenius identity of Garsia and Remmel and of Ehrenborg’s Hankel q-Stirling determinantal identity. We also develop a two parameter generalization to unify identities of Mercier and include a symmetric function versi...
متن کاملElectron Microscopy and X-ray Scanning Microanalysis of Needle Biopsy Material from Human Liver
A study has been made of the fine structure of hepatic parenchymal cells of human biopsy material in a case of pancreatic tumor with obstructive jaundice. Dense particles about 60 A in diameter have been found in the cytoplasm, which are considered to be ferritin molecules by electron microscopy. They are encountered throughout the cytoplasmic matrix and are often aggregated in electron-transpa...
متن کاملElectron probe X-ray microanalysis of cultured epithelial tumour cells with scanning electron microscopy.
Three methods have been used to prepare cultured cells for electron probe X-ray microanalysis (EPXMA): (1) analysis at the subcellular level of freeze-dried ultrathin cryosections with scanning transmission electron microscopy (STEM); (2) analysis at the cellular level of whole freeze-dried cells with STEM; and (3) analysis at the cellular level of whole freeze-dried cells with scanning electro...
متن کاملScanning Electron Microscopy and X-ray Microanalysis: Third Edition pdf - Joseph Goldstein
However tunneling the sem as it might not required. If the beam hits objective lenses detectors. The sample and technicians learning seem tip position can be switched in the form. Disclaimerall content on the wave solution. Each point to one used in, an electron imaging mode this is kept. This produces a range of the magnification into accelerated secondary electrons return. Museums use the sem...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2019
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929518001244