منابع مشابه
Magnification-continuous static calibration model of a scanning-electron microscope
We present a new calibration model of both static distortion and projection for a scanning-electron microscope (SEM). The proposed calibration model depends continuously on the magnification factor. State-of-the-art methods have proposed models to solve the static distortion and projection model but for a discrete set of low and high magnifications: at low magnifications, existing models assume...
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NIST is in the process of developing a new scanning electron microscope (SEM) magnification calibration reference standard useful at both high and low accelerating voltages. This standard will be useful for all applications to which the SEM is currently being used, but it has been specifically tailored to meet many of the particular needs of the semiconductor industry. A small number of test sa...
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A blurry background due to shallow depth of field is often desired for photographs such as portraits, but, unfortunately, small point-and-shoot cameras do not permit enough defocus because of the small diameter of their lenses. We present an image-processing technique that increases the defocus in an image to simulate the shallow depth of field of a lens with a larger aperture. Our technique es...
متن کاملForbidden Magnification ?
The twin of this paper, “Forbidden Magnification? I.” [1], presents systematic SOM simulations with the explicit magnification control scheme of Bauer, Der, and Herrmann [2] on data for which the theory does not guarantee success, namely data that are n-D, n > 2 and/or data whose components in the different dimensions are not statistically independent. For the unsupported n = 2 cases that we in...
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I present the current status of the cosmic magnification produced by systematic amplification of background sources by large-scale structures. After introducing its principle, I focus on its interests for cosmology and underline its complementary aspect to cosmic shear and galaxy auto-correlations. I finally discuss recent investigations using higher-order statistics.
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ژورنال
عنوان ژورنال: American Journal of Science
سال: 1890
ISSN: 0002-9599
DOI: 10.2475/ajs.s3-40.235.50