Metrology infrastructure for radon metrology at the environmental level
نویسندگان
چکیده
Since 2020 a large consortium has been engaged in the project EMPIR 19ENV01 traceRadon to develop missing traceability chains improve sensor networks climate observation and radiation protection. This paper presents results areas of: Novel 226Ra standard sources with continuous controlled 222Rn emanation rate, radon chambers aimed create reference atmosphere field for flux monitoring. The major challenge lies low activity concentrations of outdoor air from 1 Bq∙m-3 100 Bq∙m-3, where below there is currently no metrological at all. Thus, measured values different instruments operated locations cannot be compared respect their results. Whin this paper, new infrastructure presented, capable filling gap traceability. achieved make calibration services, far beyond state art, possible.
منابع مشابه
Nanometer-level repeatable metrology using the Nanoruler
We report on the measurement of the fringe-to-substrate phase error in our Nanoruler system. This system utilizes scanning beam interference lithography to pattern and measure large-area, nanometer-accuracy gratings that are appropriate for semiconductor and integrated opto-electronic metrology. We present the Nanonruler’s metrology system that is based on digital frequency synthesizers, acoust...
متن کاملWafer-level and Mask Critical Dimension Metrology
The principal productivity driver for the semiconductor manufacturing industry has been the ability to shrink linear dimensions. A key element of lithography is the ability to create reproducible undistorted images, both for masks and the images projected by these masks onto semiconductor structures. Lithography as a whole, fabricating the masks, printing and developing the images, and measurin...
متن کاملComputational Metrology
Coordinate measuring systems (CMSs) assess length-based characteristics of mechanical parts by measuring points on the part surface and analyzing the point data. Data analysis software can contribute significantly to the total measurement error of a CMS. Factors affecting software performance include the choice of analysis method, the quality of the software, and characteristics of the specific...
متن کاملSurface metrology
Some important types of instrumentation for measuring surfaces both past and present are reviewed. Exhaustive lists of instruments and performance are not presented; rather more emphasis is placed on the philosophy of measurement. An attempt is made to classify the surface features and also the function of surfaces as a pre-requisite to measurement. It is revealed that, as the push towards mini...
متن کاملSpeckle Metrology
5.1.1 Vibration Detection in the Presence of a Reference Wave 5.1.2 Vibration Detection without a Reference Field 5.2 Deformation Measurement by Speckle Interferometry 5.3 In-Plane Oscillations by Image Plane Recording 5.3.1 Theory 5.3.2 Time-Average Exposures of in-Plane Oscillations 5.3.3 Display of Young's Fringes 5.3.4 Comparison of Fringe Shapes for Different Motions 5.4 Tilt Analysis by F...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta IMEKO
سال: 2023
ISSN: ['0237-028X', '2221-870X']
DOI: https://doi.org/10.21014/actaimeko.v12i2.1440