Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction
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چکیده
منابع مشابه
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where the peak shapes were described by a pseudo-Voigt function and the background was modeled with an 6-term polynomial. Additionally, the PXRD patterns obtained at room temperature and 100 K were analyzed by Le Bail refinement using the GSAS and EXPGUI software, 2,3 where the peak shapes were described by a pseudo-Voigt function (CW profile function 3) and the background was modeled with an 4...
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ژورنال
عنوان ژورنال: Acta Physica Polonica A
سال: 2002
ISSN: 0587-4246,1898-794X
DOI: 10.12693/aphyspola.102.233