Measurement Results of Real Circuit Delay Degradation under Realistic Workload

With the progress of semiconductor process miniaturization, delay degradation by aging increases and threatens reliability fabricated chips. The amount is known to be circuit workload dependent, but previous evaluations are based on simulations, measurement real under realistic has not been reported yet. authors have already proposed a method, which can achieve enough accuracy measure dependent degradation. This paper reports results utilizing method. measured approximated log power-law functions. Methods correct environmental condition variation effect, mitigate approximation inaccuracy caused random developed. show large variation, attributed dependence circuits workloads. On other hand, correlation between different chips rather weak. leads conclusion that temperature transistors effect variation.