MEASUREMENT OF PHASE AND AMPLITUDE NOISE OF SEMICONDUCTOR LASERS. MEASUREMENT TECHNIQUE. CALIBRATION. RESULTS
نویسندگان
چکیده
The application of the frequency detector method for measuring phase noise spectrum semiconductor lasers has been experimentally demonstrated. is based on an unbalanced Mach-Zehnder interferometer and a photodetector. Analytical relations are obtained that allow one to choose parameters perform experimental calibration system. A technique proposed spectral components in presence slow drift delay fiber-optic lines laser under study. results low-noise DX-1 module high-noise diodes LSDLD155 (DFB) LSFLD155 (FP) presented. strong correlation between amplitude levels these found. decisive influence level optoelectronic (OE) microwave generators built using them shown. It suggested DX-1, which 20–60 dB lower (in different parts spectrum), not generator. investigated OE generator was during research this work. low noise: −120 dBc/Hz at detuning 10 kHz. Oscillation 6.8 GHz; fiber optic line length 200 m.
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ژورنال
عنوان ژورنال: Journal of radio electronics
سال: 2023
ISSN: ['1684-1719']
DOI: https://doi.org/10.30898/1684-1719.2023.8.2