Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations
نویسندگان
چکیده
منابع مشابه
Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction.
We present a model which describes the appearance of excess and deficiency features in electron backscatter diffraction (EBSD) patterns and we show how to include this effect in many-beam dynamical simulations of EBSD. The excess and deficiency features appear naturally if we take into account the anisotropy of the internal source of inelastically scattered electrons which are subsequently scat...
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The accuracy of electron backscatter diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is modeled using finite element analysis (FEA) that is adapted to the near-indentation surface profile measured by atomic force microscopy (AFM). The as...
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A ferroelectric material’s permittivity is dependent on the extrinsic contribution of domain wall displacement during the application of an external field, which can involve the motion of both 90° and 180° domain walls. Directly quantifying non-180° domain structures through diffraction based techniques is generally straightforward; as the diffraction condition will be different from one side o...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2017
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2016.11.013