Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
نویسندگان
چکیده
منابع مشابه
Influence and passivation of extended crystallographic defects in polycrystalline silicon
2014 Influence and passivation of extended crystallographic defects are investigated in large grained polycrystalline silicon wafers and N+ P solar cells. When the mean grain size exceeds 1 mm, the influence of intragrain defects becomes predominant. It was found that the defects have not by themselves a noticeable recombination activity and that the segregation of impurities (oxygen...), could...
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Photoresists, wafers, plating solutions, etchants and solvents ... Phone: +49 731 977343 0 www.microchemicals.eu [email protected] Etching of SiO2, Quartz, and Glasses with HF Hydrofluoric acid is the only etchant which attacks amorphous SiO2, quartz, or glasses at significant high etch rate. However, HF is not only a strong corrosive, but also highly toxic towards higher concentrations: ...
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ژورنال
عنوان ژورنال: Journal of Visualized Experiments
سال: 2016
ISSN: 1940-087X
DOI: 10.3791/53614