Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
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چکیده
منابع مشابه
Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM). The recently published torsional Sader method [C. P. Green et al., Rev. Sci. Instrum. 75, 1988 (2004)] facilitates the calculation of torsional spring constants of rectangular AFM cantilevers by eliminating the need to obtain information or make assumptions regarding the cantilever's material propert...
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We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantile...
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A novel diamagnetic lateral force calibrator D-LFC has been developed to directly calibrate atomic force microscope AFM cantilever-tip or -bead assemblies. This enables an AFM to accurately measure the lateral forces encountered in friction or biomechanical-testing experiments at a small length scale. In the process of development, deformation characteristics of the AFM cantilever assemblies un...
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The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations of the cantilever angle. The method accounts for the ratio of the thermal fluctuations measured in the fundamental vibration mode to the total, and also for the tilt and extended tip of the cantilever. The method is noncontact and is suitable for soft or deformable s...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2006
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.2198768