منابع مشابه
Testing Superconductor Logic Integrated Circuits
—Superconductor logic has the potential of extremely low-power consumption and ultra-fast digital signal processing. Unfortunately, the obtained yield of the present processes is low and specific faults occur. This paper deals with fault-modelling, Design-for-Test structures, and ATPG for these integrated circuits. Index Terms— Fault modelling, Design-for-Test, Defect Monitor Structures, ATPG
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ژورنال
عنوان ژورنال: IEEE Journal of Solid-State Circuits
سال: 1977
ISSN: 0018-9200
DOI: 10.1109/jssc.1977.1050886