Investigation on Microstructure and Optical Property of Nanocrystalline Silicon Thin Film
نویسندگان
چکیده
منابع مشابه
Nanocrystalline silicon thin films on PEN substrates
We study the structural and electrical properties of intrinsic layers growth close to the transition between amorphous silicon (a-Si:H) and nanocrystalline silicon (nc-Si:H) deposited on glass and PEN without intentional heating. These samples showed different behaviour in Raman shift and XRD spectra when compared with that of samples deposited at 200oC. Electrical properties of these films als...
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ژورنال
عنوان ژورنال: Journal of Coating Science and Technology
سال: 2014
ISSN: 2369-3355
DOI: 10.6000/2369-3355.2014.01.02.3