Investigation of Copper-Iron Oxide Thin Film Grown by Co-Sputtering

نویسندگان

چکیده

Bu çalışmada, sırasıyla DC magnetron ve RF püskürtme ile demir oksit bakır yapıları büyütülmüş CuxFe3-xO4 yapısı ise birlikte (Co-sputtering) büyütülmüştür. Büyütülmüş ince filmlerin yapısal optik topografik incelemeleri detaylı olarak yapılmıştır. İnce absorpsiyon ölçümleri, oda sıcaklığında Perkin Elmer UV/Visible Lambda 2S spektrometresi yardımıyla alınmıştır. Cam üzerine büyütülen Fe2O3, CuxFe3-xO4, Cu2O filmin (ahυ)2 (cm-1 eV2) karşı enerji grafiğinde çizilen fit yasak bant aralığı enerjisinin değeri 2.44, 2.39, 2.55 eV hesaplanmıştır. Ayrıca film yapılarının özellikleri, taramalı elektron mikroskobu (SEM), atomik kuvvet (AFM), X-ışını kırınımı (XRD), fotoelektron spektroskopisi (XPS) Raman incelenmiştir. XPS sonuçlarına göre; Fe3+ (Fe2O3) iyonu 2p3\2 orbitalinin için bağlanma enerjileri 710.85 (CuxFe3-xO4) 712.49 eV'dir. Cu1+ (Cu2O) enerjisi 933,64 eV'dir Cu2+ 935,58 O2- iyonların 1s 530, 528 532

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ژورنال

عنوان ژورنال: Bitlis Eren üniversitesi fen bilimleri dergisi

سال: 2023

ISSN: ['2147-3188', '2147-3129']

DOI: https://doi.org/10.17798/bitlisfen.1251421