Induced strain mechanism of current collapse in AlGaN/GaN heterostructure field-effect transistors
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چکیده
منابع مشابه
Gate leakage current mechanisms in AlGaNÕGaN heterostructure field-effect transistors
Gate leakage currents in AlGaN/GaN heterostructure field-effect transistor ~HFET! structures with conventional and polarization-enhanced barriers have been studied. Comparisons of extensive gate leakage current measurements with two-dimensional simulations show that vertical tunneling is the dominant mechanism for gate leakage current in the standard-barrier HFET and that the enhanced-barrier s...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2001
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1412282