Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review
نویسندگان
چکیده
منابع مشابه
Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples
The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM. EBSD provides quantitative microstructural information about the crystallographic nature of metals, minerals, semiconductors, and ceramics—in fact most inorganic crystalline materials. It reveals grain size, grai...
متن کاملDiffraction Patterns Obtained by Scanning Electron Microscope
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
متن کاملthe scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملTextural analysis of a microcrystalline quartz using X-Ray and Electron Backscatter Diffraction (EBSD) techniques
An unusual microcrystalline quartz texture has been recognized in the investigation of pervasively silicified ore-bearing horizons occurring in the uppermost part of carbonate platform sequences of different ages (from Precambrian to Mesozoic) and of different geotectonic settings. This peculiar texture has been labeled “grid-work texture”, and derives only by a rather fast and preferred crysta...
متن کاملTransmission EBSD from 10 nm domains in a scanning electron microscope
The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD) methods capable of measuring 120 nm particles. Here, we report a new form of low-energy transmission Kikuchi diffraction, performed in the SEM. Tran...
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ژورنال
عنوان ژورنال: Journal of Imaging
سال: 2018
ISSN: 2313-433X
DOI: 10.3390/jimaging4070088