Identification of known leaf rust resistance genes in bread wheat cultivars from China

Leaf rust caused by Puccinia triticina Eriks. (Pt) is one of the most devastating fungal pathogens affecting wheat (Triticum aestivum L.) production worldwide. Deployment resistant cultivars environmentally friendly approach to control disease. In this study, thirty-seven lines from Hubei and Shaanxi provinces in China were evaluated for seedling resistance greenhouse using eighteen Pt races. These also tested slow rusting field 2014 2018 growing seasons. Eleven molecular markers closely associated with known Lr genes used as part postulation process. Seven genes, 1, 13, 18, 14a, 26, 34 46 either singly or combination postulated twenty-five cultivars. Lr1 Lr26 commonly identified detected thirteen ten cultivars, respectively. Lr13 Lr46 each found four five Lr34 was present three Lr18 Lr14a cultivar Xi'nong 538. Six displayed tests. The study can be parents crosses aimed at pyramiding deployment leaf China.