ICEM 13 (Paris 94)
نویسندگان
چکیده
منابع مشابه
ICEM modelling of microcontroller current activity
Better prediction of electromagnetic compatibility (EMC) for components is becoming a topical demand, due to technology improvements. It is requested by integrated circuit (IC) manufacturers as well as by equipment integrators. The French UTE standardisation group has proposed an EMC modelling methodology for ICs, called ICEM (Integrated Circuit Electromagnetic Model). This proposal improves an...
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Energy management is a critical concern in wireless sensornets. Despite its importance, sensor network operating systems today provide minimal energy management support, requiring applications to explicitly manage system power states. To address this problem, we present ICEM, a device driver architecture that enables simple, energy efficient wireless sensornet applications. The key insight behi...
متن کاملUniversité Paris Diderot — Paris 7
This thesis deals with statistical questions raised by the analysis of highdimensional genomic data for cancer research. In the first part, we study asymptotic properties of multiple testing procedures that aim at controlling the False Discovery Rate (FDR), that is, the expected False Discovery Proportion (FDP) among rejected hypotheses. We develop a versatile formalism to calculate the asympto...
متن کاملInternational Conference on Exogenous Factors Affecting Thrombosis and Haemostasis. Paris, France, July 12-13, 2001. Proceedings.
متن کامل
NHCU-HEP-94-13 Classical N=2 W-superalgebras From Superpseudodifferential Operators
We study the supersymmetric Gelfand-Dickey algebras associated with the superpseu-dodifferential operators of positive as well as negative leading order. We show that, upon the usual constraint, these algebras contain the N=2 super Virasoro algebra as a subal-gebra when the leading order is odd. The decompositions of the coefficient functions into N=1 primary fields are then obtained by covaria...
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ژورنال
عنوان ژورنال: Microscopy Microanalysis Microstructures
سال: 1993
ISSN: 1154-2799
DOI: 10.1051/mmm:01993004010100