High-temperature ferroelectric domain stability in epitaxial PbZr0.2Ti0.8O3 thin films

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Domain wall roughness in epitaxial ferroelectric PbZr0.2Ti0.8O3 thin films.

The static configuration of ferroelectric domain walls was investigated using atomic force microscopy on epitaxial PbZr(0.2)Ti(0.8)O(3) thin films. Measurements of domain wall roughness reveal a power-law growth of the correlation function of relative displacements B(L) alpha L(2zeta) with zeta approximately 0.26 at short length scales L, followed by an apparent saturation at large L. In the sa...

متن کامل

Ferroelectric domain structures of epitaxial „001... BiFeO3 thin films

Ferroelectric domain structures of epitaxial BiFeO3 thin films on miscut 001 SrTiO3 substrates have been studied by transmission electron microscopy. BiFeO3 on 0.8° miscut substrates are composed of both 109° and 71° domains; in contrast, only 71° stripe domains are observed in BiFeO3 on 4° miscut 001 SrTiO3 substrates. The domain width in BiFeO3 on 4° miscut substrates increases as film thickn...

متن کامل

Ferroelectric domain morphologies of „001... PbZr1−xTixO3 epitaxial thin films

Ferroelectric domain morphologies in s001d PbZr1−xTixO3 epitaxial thin films were studied using the phase-field approach. The film is assumed to have a stress-free top surface and is subject to a biaxial substrate constraint. Both the electrostatic open-circuit and short-circuit boundary conditions on the film surfaces were considered. The phase-field simulations indicated that in addition to t...

متن کامل

Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films

Voltage-modulated scanning force microscopy ~Piezoresponse microscopy! is applied to investigate the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on ~001! SrTiO3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vec...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 2006

ISSN: 0003-6951,1077-3118

DOI: 10.1063/1.2196482