High Energy X-Ray Dosimetry Using (ZnO)0.2(TeO2)0.8 Thin Filmbased Real-time X-Ray Sensor

This study reports the dosimetric response of a (ZnO)0.2(TeO2)0.8 thin film sensor irradiated with high-energy X-ray radiation at various doses. The spray pyrolysis method was used for deposition on soda-lime glass substrate using zinc acetate dehydrate and tellurium dioxide powder as starting precursors. structural morphological properties were determined. I-V characteristics measurements performed during irradiation 6 MV beam from Linac. results revealed that XRD pattern AS-deposited is non-crystalline (amorphous) in nature. FESEM image shows non-uniform shape nanoparticles agglomerated separately, EDX spectrum presence Te, Zn, O film. indicate current density increases linearly doses (0-250 cGy) all applied voltages (1-6 V). sensitivity has been found to be range 0.37-0.94 mA/cm2 /Gy. current-voltage measurement test fading normalised percentage day 0 order > 15 30 1 2. These are expected beneficial fabricating cheap practical sensors.