Functional test generation for synchronous sequential circuits
نویسندگان
چکیده
منابع مشابه
On the Use of Functional Test Generation in Diagnostic Test Generation for Synchronous Sequential Circuits
We study the relationship between diagnostic test generation for a gate-level fault model, which is used for generating diagnostic test sets for manufacturing defects, and functional test generation for a high-level fault model. In general, a functional fault may partially represent some of the effects of one gate-level fault but not another. Generating a test sequence for the functional fault ...
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This paper presents a new approach to test pattern generation for sequential circuits modeled as finite state machines. Based on a functional fault model, only a restricted set of transitions of the finite state machine (FSM) is considered for the purpose of testing. A new state discriminating sequence, referred to as EUIO is proposed. Overlapping is accomplished to reduce the test length. In m...
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The feasibility of generating high quality functional test vectors f o r sequential circuits using the Growth (G) and Disappearance ( 0 ) fault model has been demonstrated earlier. In this paper we provide a theoretical validation of the G and D fault model b y proving the ability of this model t o guarantee complete stuck fault coverage an combinational and sequential circuits synthesized empl...
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We present a novel, highly efficient functional test generation methodology for synchronous sequential circuits. We generate test vectors for the growth (G) and disappearance (D) faults using a cube description of the finite state machine (FSM). Theoretical results establish that these tests guarantee a complete coverage of stuck faults in combinational and sequential circuits, synthesized thro...
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The dissertation thesis is aimed at test generation for asynchronous sequential digital circuits, contributes to their timeand cost-effective testing, and indirectly supports their wider application, which improves the performance, the power consumption and the electromagnetic emission of future digital circuits. The main scientific contribution is design of the new test generator (optimized fo...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 1996
ISSN: 0278-0070
DOI: 10.1109/43.503950