FIELD ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF Nb3 Sn WIRES
نویسندگان
چکیده
منابع مشابه
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy i...
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ژورنال
عنوان ژورنال: Le Journal de Physique Colloques
سال: 1986
ISSN: 0449-1947
DOI: 10.1051/jphyscol:1986242