Field emission characteristics of the scanning tunneling microscope for nanolithography
نویسندگان
چکیده
منابع مشابه
Studying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملTime-resolved scanning tunneling microscope light emission spectroscopy of Sb2Te3
We have successfully added ps temporal resolution to scanning tunneling microscope (STM) light emission spectroscopy. STM light emission spectra of Sb2Te3 were measured in the configuration that the tip sample gap of the STM is irradiated by a pair of pump and probe laser pulses with a duration less than 2 ps each, and were analyzed as a function of optical delay time between the pump and probe...
متن کاملTheory of the scanning tunneling microscope.
We present a theory for tunneling between a real surface and a model probe tip, applicable to the recently developed "scanning tunneling microscope." The tunneling current is found to be proportional to the local density of states of the surface, at the position of the tip. The effective lateral resolution is related to the tip radius R and the vacuum gap distance d approximately as [(2 A)(R +d...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
سال: 1996
ISSN: 0734-211X
DOI: 10.1116/1.588751