FIB Sample Preparation Using Flash Electropolishing
نویسندگان
چکیده
منابع مشابه
TEM Sample Preparation and FIB-Induced Damage
Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino, and Joseph Michael preparation can be applied to almost any material type—hard, soft, or combinations thereof. The number of materials for which successful TEM sample preparation with FIBs has been documented certainly reaches several hundred and spans from hard matter such as metals, ceramics, and composites to soft matter including polymers, ...
متن کاملFIB Sample Preparation of Polymer Thin Films on Hard Substrates Using the Shadow-FIB Method
Focused ion beam (FIB) instrumentation has proven to be extremely useful for preparing cross-sectional samples for transmission electron microscopy (TEM) investigations. The two most widely used methods involve milling a trench on either side of an electron-transparent window: the “H-bar” and the “lift-out” methods [1]. Although these two methods are very powerful in their versatility and abili...
متن کاملHigh Speed TEM Sample Preparation by Xe FIB
Preparation of Transmission Electron Microscope (TEM) samples by Focused Ion Beam (FIB) milling is one of the most precise techniques now routinely used for example in failure analysis or material science. These TEM samples are commonly prepared using Ga FIB technology, starting more than 20 years ago [13]. Presently FIB columns are commonly combined with the Scanning Electron Microscopy (SEM) ...
متن کاملPost-FIB TEM Sample Preparation Using A Low Energy Argon Beam
Despite the significant advances in the transmission electron microscope (TEM), such as application of aberration correction and monochromation [1], sample preparation is still one of the most critical steps determining the quality, and precision of the results. The important challenge here is to prepare samples that are thin enough for electron transparency, free from any surface damage and al...
متن کاملA novel cryo-FIB lift-out procedure for cryo-TEM sample preparation
The focused-ion-beam (FIB) is the method of choice for site-specific sample preparation for Transmission Electron Microscopy (TEM) in material sciences. A lamella can be physically lifted out from a specific region of a bulk specimen with submicrometer precision and thinned to electron transparency for high-resolution imaging in the TEM. The possibility to use this tool in life sciences applica...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of The Surface Finishing Society of Japan
سال: 2022
ISSN: ['1884-3409', '0915-1869']
DOI: https://doi.org/10.4139/sfj.73.546