Examining nanoparticle assemblies using high spatial resolution x-ray microtomography

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Examining nanoparticle assemblies using high spatial resolution x-ray microtomography

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 2004

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.1776635