Ex situ Lift Out of PFIB Prepared TEM Specimens
نویسندگان
چکیده
منابع مشابه
Ex situ Lift Out of PFIB Prepared TEM Specimens
Inductively coupled plasma sources are capable of producing Xe + ions for commercial focused ion beam (FIB) applications [1,2]. It should be no surprise that the longstanding Ga + FIB strategies for transmission electron microscopy (TEM) specimen preparation are directly applicable and transferrable to the plasma FIB (PFIB). Indeed, we showed a few years ago that the Xe + PFIB can produce elect...
متن کاملTheory and New Applications of Ex Situ Lift Out.
The ex situ lift out (EXLO) adhesion forces are reviewed and new applications of EXLO for focused ion beam (FIB)-prepared specimens are described. EXLO is used to manipulate electron transparent specimens on microelectromechanical systems carrier devices designed for in situ electron microscope analysis. A new patented grid design without a support film is described for EXLO. This new slotted g...
متن کاملIn Situ and Ex Situ TEM Study of Lithiation Behaviours of Porous Silicon Nanostructures
In this work, we study the lithiation behaviours of both porous silicon (Si) nanoparticles and porous Si nanowires by in situ and ex situ transmission electron microscopy (TEM) and compare them with solid Si nanoparticles and nanowires. The in situ TEM observation reveals that the critical fracture diameter of porous Si particles reaches up to 1.52 μm, which is much larger than the previously r...
متن کاملCoupling In Situ TEM and Ex Situ Analysis to Understand Heterogeneous Sodiation of Antimony.
We employed an in situ electrochemical cell in the transmission electron microscope (TEM) together with ex situ time-of-flight, secondary-ion mass spectrometry (TOF-SIMS) depth profiling, and FIB-helium ion scanning microscope (HIM) imaging to detail the structural and compositional changes associated with Na/Na(+) charging/discharging of 50 and 100 nm thin films of Sb. TOF-SIMS on a partially ...
متن کاملA novel cryo-FIB lift-out procedure for cryo-TEM sample preparation
The focused-ion-beam (FIB) is the method of choice for site-specific sample preparation for Transmission Electron Microscopy (TEM) in material sciences. A lamella can be physically lifted out from a specific region of a bulk specimen with submicrometer precision and thinned to electron transparency for high-resolution imaging in the TEM. The possibility to use this tool in life sciences applica...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614003420