منابع مشابه
Electron-beam lithography applications at ETH Zurich
A triangular lattice of holes is etched deeply (> 3 μm) into the substrate using a combination of EBL and inductively coupled plasma reactive ion etching. Accuracy and reliability of the pattern transfer into the resist by EBL is ensured by using the NanoPECS software to correct for proximity effects. Devices are designed using 2D and 3D modelling tools and characterized using the End-Fire (por...
متن کاملSynthetic Biology 3 . 0 June 24 – 26 , 2007 ETH Zurich , Switzerland Conference Proceedings
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Chair of Software Engineering at ETH Zurich , Switzerland Software verification course –
environment assigning intervals to program variables. Writing X = {x1 ← �1� � � � � x� ← ��} for the function X mapping x� to �� such that X (x�) = ��, � = 1� � � � � �, the interval invariance equations would be 4 One of the 64 bits is used for garbage collection. 12 P. C����� X1 = {x ← [min_int� max_int]} X2 = {x ← [1� 1] � L X3(x) = ∅ ? ∅ : let [�� �] = X3(x) in [min(� + 1� ma...
متن کاملFreefinement Stephan van Staden ETH Zurich
Freefinement is an algorithm that constructs a sound refinement calculus from a verification system under certain conditions. In this paper, a verification system is any formal system for establishing whether an inductively defined term, typically a program, satisfies a specification. Examples of verification systems include Hoare logics and type systems. Freefinement first extends the term lan...
متن کاملETH Zurich at TREC Clinical Decision Support 2016
This paper describes ETH Zurich’s submission to the TREC 2016 Clinical Decision Support (CDS) track. In three successive stages, we apply query expansion based on literal as well as semantic term matches, rank documents in a negation-aware manner and, finally, re-rank them based on clinical intent types as well as semantic and conceptual affinity to the medical case in question. Empirical resul...
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ژورنال
عنوان ژورنال: Journal of the Japan society of photogrammetry and remote sensing
سال: 2005
ISSN: 0285-5844,1883-9061
DOI: 10.4287/jsprs.44.4_31