Estimation of the uncertainty for a phase noise optoelectronic metrology system

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Estimation of the uncertainty for a phase noise optoelectronic metrology system

A configuration of phase noise measurement system operating in X-band (8.2-12.4 GHz) using a photonic delay line as a frequency discriminator is presented in this paper. This system doesn’t need any excellent frequency reference and works for any frequency in this band. Oscillator frequency fluctuation is converted to phase frequency fluctuation through the delay line. The measured phase noise ...

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ژورنال

عنوان ژورنال: Physica Scripta

سال: 2012

ISSN: 0031-8949,1402-4896

DOI: 10.1088/0031-8949/2012/t149/014025