Estimating the Yield Strength of Thin Metal Films Through Elastic–Plastic Buckling-Induced Debonding
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چکیده
منابع مشابه
The yield strength of thin copper films on Kapton
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ژورنال
عنوان ژورنال: IEEE Transactions on Device and Materials Reliability
سال: 2011
ISSN: 1530-4388,1558-2574
DOI: 10.1109/tdmr.2011.2112362