Electrostatic Friction Force on an AFM Probe Moving Near a Sample Surface
نویسندگان
چکیده
منابع مشابه
Electrostatic force spectroscopy of near surface localized states
Abstract Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a semiconductor. Measurement of the frequency shift of the cantilever as a function of tip-sample shows discrete peaks at certain voltages when the tip is located ...
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ژورنال
عنوان ژورنال: Technical Physics
سال: 2018
ISSN: 1063-7842,1090-6525
DOI: 10.1134/s1063784218110075