Echo TEMPEST: EM Information Leakage Induced by IEMI for Electronic Devices

Electromagnetic (EM) information leakage encourages attacks, wherein the attackers passively capture and analyze EM waves that are unintentionally generated by devices. Generally, devices with weak emission intensities not targeted. However, even these would be subject to attacks if it becomes possible actively sense electrical changes occur within them when is processed. This article demonstrates feasibility of threat induced active sensing input impedance in input/output (I/O) circuit an integrated (IC). Specifically, was transmitted from IC, were measured irradiating outside target device. labels as Echo TEMPEST. The experiment validated TEMPEST evaluation board simulated I/O UART modules, USB keyboards. It also demonstrated could control distance (obtained device), depending on intensity irradiated waves. Furthermore, we discussed countermeasure methods focusing conditions for executing