Dynamic-Bias S-Parameters: A New Measurement Technique for Microwave Transistors
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: IEEE Transactions on Microwave Theory and Techniques
سال: 2016
ISSN: 0018-9480,1557-9670
DOI: 10.1109/tmtt.2016.2608344