Dual integrated actuators for extended range high speed atomic force microscopy

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چکیده

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Dual Actuation for High Speed Atomic Force Microscopy

In atomic force microscopy (AFM) the imaging speed is strongly limited by the bandwidth of the feedback loop that controls the interaction between the measurement tip and the sample. A significant increase in closed-loop bandwidth can be achieved by combining a long-range, low-bandwidth actuator with a short-range, high-bandwidth actuator, forming a dual actuated system. This contribution discu...

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Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 microm wide cantilevers which combine high resonance ...

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Studying biological membranes with extended range high-speed atomic force microscopy

High-speed atomic force microscopy has proven to be a valuable tool for the study of biomolecular systems at the nanoscale. Expanding its application to larger biological specimens such as membranes or cells has, however, proven difficult, often requiring fundamental changes in the AFM instrument. Here we show a way to utilize conventional AFM instrumentation with minor alterations to perform h...

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Corrigendum: Studying biological membranes with extended range high-speed atomic force microscopy.

References 1. Soltani Bozchalooi, I., Youcef-Toumi, K., Burns, D. J. & Fantner, G. E. Compensator design for improved counterbalancing in high speed atomic force microscopy. The Review of scientific instruments 82(11), 113712 (2011). 2. Soltani Bozchalooi, I. & Youcef-Toumi, K. Multi-actuation and PI control: a simple recipe for high-speed and large-range atomic force microscopy. Ultramicroscop...

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ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 1999

ISSN: 0003-6951,1077-3118

DOI: 10.1063/1.124779