Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link

The long-term reliability of the commercially available vertical-cavity surface-emitting laser (VCSEL) at 1310 nm wavelength is investigated. To do so, a high current accelerated life test used to evaluate VCSEL reliability. Variations properties that depend on operating condition are characterized by light-current-voltage, leakage and low-frequency noise. When aging 6 mA, 8 mA 10 maximum output power reduces 5%, 6% 15% initial value, respectively. It demonstrated theoretically experimentally increases reverse bias breakdown voltage decreases after test. noise spectral density device ages, with augment electrical stress. below threshold, frequency index factor amplitude gradually increase increase. Further, lifetime fitting curves devices an accelerating obtained, median 67 years extrapolated.